| Field | Type | Description |
|---|---|---|
|
parameters |
struct with the fields described in parameters table |
Parameter values used for setting up the QA test bench. |
|
relative_tolerances |
struct |
The relative tolerances for QA tests which verify the different figures of merit of the ring modulator. If the simulated values differ from the values provided in the data file by more than these tolerance, the QA tests will fail. This struct accepts relative tolerance values as numbers for the following FOMs:
|
parameters
| Field | Type | Description |
|---|---|---|
|
radius
|
matrix |
Radius values for all tests provided as a 1xN matrix where N is the number of values provided. |
|
coupling_length
|
matrix |
Coupling length values for all tests provided as a 1xN matrix where N is the number of values provided. |
|
coupling_gap_through
|
matrix |
Coupling gap values of bus 1 (in and through ports) for all tests provided as a 1xN matrix where N is the number of values provided. |
|
coupling_gap_drop
|
matrix |
Coupling gap values of bus 2 (drop and add ports) for all tests provided as a 1xN matrix where N is the number of values provided. Note: For single-bus rings, this parameter is not required. |
|
BW_bias
|
number |
Bias for electrical bandwidth test. Note: For a ring without electrical modulation, this parameter should not be provided. |
| thermal_BW_bias | number |
Bias for thermal bandwidth test. Used for Verilog-A QA only. Note: For a ring without thermal tuner, this parameter should not be provided. |
| imp_amplitude |
number |
Amplitude of the impulse in the electrical bandwidth test. Note: For a ring without electrical modulation, this parameter should not be provided. |
| sample_rate |
number |
Sample rate for time domain tests (restricted by the minimum requirement for the device). |