Note: For legacy data format (2022 R2.4 and older) please visit following link:
ring_modulator_parameterized QA (Legacy)
Photonic Model: ring_modulator_parameterized
Information on QA tests and QA types: Introduction to Quality Assurance (QA) tests
Instructions on running QA tests: Running QA tests in CML Compiler
QA tests
QA script | QA type | FOMs | Comments |
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ring_modulator_parameterized_resonant_wl_IL_FSR_Q_IL_drop_ER_qa.lsf |
Behaviour |
Resonant wavelength (wl), Insertion loss at through port (IL) and drop port (IL_drop),FSR, ER, Q | |
Behaviour |
Modulation efficiency |
Electrical modulator is present |
|
Behaviour |
Thermal_Ppi |
Thermal tuner is present |
|
Behaviour |
dneff_dT |
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Behaviour |
Electrical_BW |
Electrical modulator is present |
QA Variables
These variables are defined as below in a struct named "QA" in the source data file:
[[snippet||11724235486611]]
QA scripts
For all QAs except for the dneff_dTQA, the simulations are run for all the test parameter value combinations (test_radius, test_Lc, test_coupling_gap_through, test_coupling_gap_drop) provided in the QA variables section.
ring_modulator_parameterized_resonant_wl_IL_FSR_Q_IL_drop_ER_qa.lsf
ring_modulator_parameterized_dneff_dT_qa.lsf
Following test-bench is used to extract the gain spectrum and extract FOMs. These values will be compared to source data and made sure the difference is within the tolerance. For the dneff_dT test, the simulation temperature is varied to extract the shift in resonant wavelength as a function of temperature.
QA type | FOMs | QA variables |
---|---|---|
Behavior test |
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relative_tolerances:
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[[NOTE:]] The ring modulator is capable of tuning for IL or ER. If both values are provided, the compact model will be tuned for IL. Similarly, if both values are provided, QA will only test IL and check it vs the value provided in source data. |
ring_modulator_parameterized_modulation_efficiency_qa.lsf
In this test bench, two ring modulator compact models are biased with voltage values provided in "ref1" and "ref2" within the mod_eff FOM in source data file, and the gain spectrum for these two cases are obtained. Resonant wavelengths for these two bias points are extracted. Modulation efficiency is then calculated and compared to the value provided for "mod_eff" in source data and made sure the difference is within the tolerance values.
QA type | FOMs | QA variables |
---|---|---|
Behavior test |
mod_eff |
relative_tolerances:
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ring_modulator_parameterized_thermal_Ppi_qa.lsf
In this test-bench the thermal tuners of two ring modulator compact models are biased based on the power values provided in "ref1" and "ref2" within the mod_eff_thermal FOM in source data file and the gain spectrums are obtained. Finding the resonant wavelength for each case, thermal modulation efficiency is extracted and compared to "mod_eff_thermal" value in source data and make sure the difference is within the tolerance value.
QA type | FOMs | QA variables |
---|---|---|
Behavior test |
mod_eff_thermal |
relative_tolerances:
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ring_modulator_parameterized_electrical_BW_qa.lsf
Following two test-benches are used to extract electrical bandwidth for the ring modulator compact model by performing a Fourier transform on the impulse response. Net 3dB bandwidth can be extracted from the first circuit (left) with a bias point defined in source data as "BW_bias" within the "parameters" field of the "QA" struct. Optical 3dB bandwidth can be extracted from the second circuit (right) with 0V bias. 3dB electrical bandwidth at the defined bias point can be obtained from these values and compared to data provided in "bandwidth_data" of the "electrical_tuner_data" in source data and made sure the difference is within the tolerance value.
QA type | FOMs | QA variables |
---|---|---|
Behavior test |
electrical_tuner_data:
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parameters:
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