Monitors record data from simulations.
Different monitor types are used to measure different types of information.
For example, an index monitor can be used to measure the refractive index of the structure,
a time monitor can be used to measure the electric fields over time, and a frequency
domain power monitor can be used to record transmission and reflection.
In the following units we will go over common monitor settings, and then introduce each
type of monitor in detail.
We will also introduce the port object, which can act as both a monitor and a source and
is available characterizing the scattering parameters, or S-parameters of a component
element of a photonic integrated circuit.
S-parameters give the complex reflection and transmission coefficients of a device.
More detailed information about monitors can also be found in the online Knowledge Base
in the Component Tools Reference Guide Monitors chapter including information about the definitions
of each of the settings for each type of monitor.
Information about ports can be found under the Simulation chapter.